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Model 2470

The 2470 High Voltage SourceMeter® Source Measure

Unit (SMU) Instrument brings advanced Touch, Test,

Invent® technology right to your fingertips. It combines an

innovative graphical user interface (GUI) with capacitive

touchscreen technology to make testing intuitive and

minimize the learning curve to help engineers and

scientists learn faster, work smarter, and invent easier.

With its 1100 V and 10 fA capability, the 2470 is optimized

for characterizing and testing high voltage, low leakage

devices, materials, and modules, such as silicon

carbide (SiC), gallium nitride (GaN), power MOSFETs,

transient suppression devices, circuit protection devices,

power modules, batteries, and much more. These

new capabilities, combined with Keithley’s decades of

expertise in developing high precision, high-accuracy

SMU instruments, make the 2470 a “go-to instrument”

for high-voltage source and low-current measurement

applications in the lab and in the test rack.

• Wide coverage up to 1100 V / 1 A DC 20 W max.

• 10 fA measure resolution

• 0.012% basic measure accuracy with 6½-digit resolution

• Five-inch, high resolution capacitive touch screen GUI

• Source and sink (4-quadrant) operation

• SCPI and TSP® scripting programming modes

• TSP-Link for multi-channel I-V testing

• Front panel input banana jacks; rear panel

high-voltage input triaxial connections

• Built-in context-sensitive help

• Front-panel USB 2.0 memory I/O port for transferring

data, test scripts, and test configurations

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