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  3. Solar Cell 측정 시스템

Solar Cell 측정 시스템

Simplify Your Solar Cell Testing with
Keithley’s Precision Measurement Solutions

Keithley’s solutions for solar cellI-V and C-V characterization provide the most accurate measurements available without the hassles of integrating separate instruments or writing complicated programs.

Model 4200-SCS
SeMiConduCTor CharaCTerizaTion SYSTeM
  • Fully integrated I-V and C-V turn key solution with intuitive graphical user interface
  • Built-in libraries for extracting key cell parameters, and advanced analytical and formulation tools
SerieS 2400 or 2600a
SourCeMeTer ® inSTruMenTS
  • 4-quadrant design provides both source and sink capability for complete IV

Electrical characterization of a variety of solar cell (Photovoltaic) technologies, including:

  • Mono Crystalline Si
  • CIGS
  • Poly Crystalline Si
  • CdTe
  • Amorphous Si
  • Polymer Organic

Measurement of key parameters including:

  • Open circuit voltage(Voc)
  • Shunt resistance (Rsh)
  • Short circuit current (Isc)
  • Conversion efficiency (η)
  • Maximum power output (Pmax)
  • Doping density (N)
  • Voltage at Pmax (Vmax)
  • Cell resistivity
  • Fill factor (ff)
  • Defect density
  • Series resistance (Rs)


specifications are subject to change without notice.
all Keithley trademarks and trade names are the property of Keithley instruments, inc.
all other trademarks and trade names are the property of their respective companies.

Solar Cell Characterization Basics Efficiency Testing Made Simple